Conference on Precision Electromagnetic Measurements

The Conference on Precision Electromagnetic Measurements is a biennial meeting of experts on electrical and related metrology. It was held in Paris 8th-13th July 2018.

The work of the e-SI-Amp consortium on small current measurement and generation was well represented. Some of these presentations were written up into detailed, peer-reviewed papers listed below.

M. Götz et al. Calibrating Ultrastable Low-Noise Current Amplifiers of the Second Generation With a Cryogenic Current Comparator.
IEEE Transactions on Instrumentation and Measurement 68, 2027-2033 (2019).
http://dx.doi.org/10.1109/TIM.2018.2884060 (open access pdf)

O. Erkan et al. Reference Ultralow DC Current Source Between 1 fA and 100 pA at TUBITAK UME.
IEEE Transactions on Instrumentation and Measurement 68, 2201-2207 (2019).
http://dx.doi.org/10.1109/TIM.2019.2895435 

S. P. Giblin et al. Interlaboratory Nanoamp Current Comparison With Subpart-Per-Million Uncertainty.
IEEE Transactions on Instrumentation and Measurement 68, 1996-2002 (2019).
http://dx.doi.org/10.1109/TIM.2018.2879126 (open access pre-print)